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Monday, November 30, 2020 | History

2 edition of Development of a testing methodology to predict optical disk life expectancy values found in the catalog.

Development of a testing methodology to predict optical disk life expectancy values

Fernando L. Podio

Development of a testing methodology to predict optical disk life expectancy values

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  • 13 Currently reading

Published by U.S. Dept. of Commerce, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O. in Gaithersburg, MD, Washington, DC .
Written in English

    Subjects:
  • Optical disks -- Testing.,
  • Service life (Engineering)

  • Edition Notes

    StatementFernando L. Podio.
    SeriesNIST special publication ;, 500-200., Computer systems technology, NIST special publication ;, 500-200., NIST special publication.
    ContributionsNational Institute of Standards and Technology (U.S.)
    Classifications
    LC ClassificationsQC100 .U57 no. 500-200, TK7895.M4 .U57 no. 500-200
    The Physical Object
    Paginationxv, 84 p. :
    Number of Pages84
    ID Numbers
    Open LibraryOL1322350M
    LC Control Number92198680

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Development of a testing methodology to predict optical disk life expectancy values by Fernando L. Podio Download PDF EPUB FB2

Get this from a library. Development of a testing methodology to predict optical disk life expectancy values. [Fernando L Podio; National Institute of Standards and Technology (U.S.)].

The true life expectancy optical media is unknown and perhaps unknowable. Many factors affect optical media longevity. Many factors affect optical media longevity.

Longevity estimates depend on expensive, time-consuming, narrowly-defined tests, the results of which can be subject to wide interpretation. Book Reviews [HTML] JAICVol Number 1, Article 7 (pp. 84 to 91) Napier-Cain, Elizabeth A Study of Shrink Wrapped, Simulated Bound Volumes [HTML] () National Archives and Records Administration Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values.

The life expectancy rating of any optical media shall be demonstrated according to criteria established by the National Institute of Standards and Technology in Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values (NIST Special Publication 5OO-2OO).

A 'read' is counted each time someone views a publication summary (such as the title, abstract, and list of authors), clicks on a figure, or views or downloads the full-text. Digital-Imaging and Optical Digital Data Disk Storage Systems: Long-Term Access Strategies for Federal Agencies July A Report by: The Technology Research Staff The National Archives at College Park Adelphi Road College Park, Maryland Appendix A: Federal Agency Site Visit Reports Site Visit Selection Criteria NARA's Technology Research Staff conducted a.

Proc. SPIERecent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, pg 2 (30 November ); doi: / 3. The life expectancy (LE) rating of any recording medium used for public records, corresponding to the retention period of such records, unless otherwise provided for under the standards, rules and guidelines promulgated by the State Records Committee; and 4.

After thermal cycling, the highest KIc values were measured for lithium disilicate ceramic IPS CAD, followed by resin composite materials Ambarino High-Class (p. Accelerated Cycle Life Testing and Capacity Degradation Modeling of LiCoO 2-graphite Cells, Weiping Diao, Saurabh Saxena, and Michael Pecht, Journal of Power Sources, Vol.SeptemberDOI: /ur n.

~ A laboratory procedure that estimates a material's rate of deterioration, making it possible to predict its life expectancy. (Many tests are based on the Arrhenius function, which predicts that materials age in a predictable manner relative to temperature.

The two angles of this development have been considered: physicochemical and thermomechanical one. The goal of the first one is the selection of the optimized filler metal and brazing parameters for the studied joints; and in the second one the geometrical aspect is taken into account to improve the in-service life duration of the assembly.

Earlier work on the testing methodology to predict optical disk life expectancy values is the subject of NIST special publication (SP)which has been widely distributed and has been the basis for subsequent standards work.

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